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lithography systems


2100SPE Brochure


High-density PCB



Laser projection imaging (LPI) for high-volume production


The Anvik HexScanTM 2100 SPE laser projection imaging (LPI) system represents a revolutionary advance in large-format lithography systems. It offers the unique combination of high-resolution projection imaging, large-area substrate handling, and high-precision alignment, making it the ideal exposure tool for cost-effective, volume manufacturing of high-performance printed circuit boards. With its excimer laser illumination source emitting 40 - 50 watts of UV radiation, this high-throughput system serves both as a primary imaging tool for conventional dry-film or liquid resists, and as an efficient exposure system for solder masks and other layers requiring high doses.




Large-format substrate handling

  • Designed for projection imaging of board sizes up to 610 x 915 mm (24 x 36 inches) and larger (1100 x 1250 mm); scalable to 1500 x 1800 mm.

  • Capable of handling panels of a wide range of thicknesses, with no mask-to-panel contact

  • Ideal for imaging rigid and flexible substrates, and both inner and outer layers



High resolution, fine alignment

  • Resolution of 10 micron (0.4 mil) features (lines, spaces, holes)

  • Patented seamless scanning technology (HexScanTM) delivers lens resolution over entire panel

  • Fully automatic alignment with precision of + 2.5 microns (+ 0.1 mil) for layer-to-layer, front-to-back, or mask-to-board registration



Very high exposure throughput

Exposure throughputs of 120 panels/hr (18 x 24 inch panels) with conventional photoresists, made possible by

  • Seamless scanning with large-area hexagonal illumination beam

  • High-power excimer laser illumination system

  • Single-planar, high-speed, high-precision scanning stage



Versatility

  • Delivers very high throughput for lithography in a wide range of photoresist materials

  • Capable of patterning with a variety of mask materials, including mylar, glass, and fused silica

  • Capable of batch via generation in a variety of polymeric dielectrics



Modularity and upgradability

  • Modular design enables user to define optimum system configuration

  • Available with Anvik's patented independent x-y scaling capability (up to 5000 ppm) to compensate for process-induced dimensional changes in panel (see ref. 3 below)

  • Available with Anvik's patented Variable-Area Substrate Tiling (VASTTM) technology to populate panel with modules of different sizes




HexScanTM 2100 SPE Specifications
Imaging Technique Seamless scanning projection
Resolution 10 microns (0.4 mil)
Projection System 1:1 magnification refractive lens
Depth of Focus 560 microns (22 mils)
Substrate Size Up to 1100 x 1250 mm (44 x 50 in), with or without tiling
Illumination Source XeF excimer laser (other sources optional)
Exposure Wavelength 351 nm (other wavelengths optional)
Overlay Precision 2.5 microns (0.1 mil)
Alignment System Automatic
Panel and Mask Handling Automatic
Exposure Throughput 120 panels/hr (18 x 24 in panels)
System Price USD 750K - 1.2M



For additional information:

  1. K. Jain et al., "High-Speed, High-Resolution, Large-Area Exposure System for PCB Patterning," Printed Circuit Fabrication, Vol. 20, No. 5, p. 34, May 1997.

  2. K. Jain et al., "Large-Area, High-Resolution Lithography and Photoablation Systems for Microelectronics and Optoelectronics Fabrication", Proc. IEEE, Vol. 90, No. 10, p. 1681, Oct. 2002. [Click here for a pdf copy of this paper.]

  3. M. Zemel et al., "X-Y Scaling Compensation Technology for Fine-Line PCB Imaging with High-Precision Alignment", IPC Printed Circuit Expo, Proc. of Technical Conf., p. S03-1-1, Long Beach, CA, Mar. 26-28, 2002. [Click here for a pdf copy of this paper.]

  4. K. Jain et al., "Large-Area, High-Throughput, High-Resolution Lithography Systems for Flat-Panel Displays and Microelectronic Modules," Proc. SPIE, Vol. 3331, p. 197, 1998.

  5. K. Jain, Large-Area, High-Throughput, High-Resolution Projection Imaging System, U.S. Pat. 5,285,236, issued Feb. 8, 1994.

  6. K. Jain, Scan and Repeat High Resolution Lithography System, U.S. Pat. 4,924,257, issued May 8, 1990.




View System Schematic

View Examples of Results

Limitations of Other Lithography and Via Generation Tools

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